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40nm mixed signal test chip taped out by Cosmic Circuits

By siliconindia   |   Friday, 10 July 2009, 01:32 IST
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40nm mixed signal test chip taped out by Cosmic Circuits
Bangalore: Cosmic Circuits, a provider of differentiated analog and mixed-signal IP cores, announced the tape out of its TSMC 40nm mixed signal test chip. The test chip consists of several data converters and power regulators for wireless communications and portable consumer applications. Analog to digital (A/D) and digital to analog (D/A) converters, which are used in the baseband section of wireless communication chips for applications such as MIMO WLAN 802.11n and WiMAX are included in this test chip, along with the low jitter phase-locked loop (PLLs). The A/D Converters range from 8-10 bit resolutions at 20-80 MHz sampling rate and D/A Converters' specification are 8-bit / 20MHz and 12-bit / 160MHz. Also included are Switching and Linear Power-Regulator cores that help optimize battery life and reduce BOM cost in Portable consumer applications. "This test chip brings complex and differentiated Analog IP cores to the market, now in cutting edge 40nm technology node" said Krishnan Ramabadran, Vice President of Marketing for Cosmic Circuits. "These cores address the critical need for power reduction and system cost optimization as wireless and portable consumer markets progress to the 40nm node," Ramabadran added.

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