Tektronix introduces test tools for MIPI M-PHY debug and validation
By siliconindia   |   Wednesday, 29 September 2010, 19:10 IST
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Bangalore: Tektronix, manufacturers of oscilloscopes, introduced new testing tools for the MIPI Alliance M-PHY standard, allowing customers to immediately get started with performance verification and debug for this important new specification using Tektronix DPO/DSA/MSO70000B Series oscilloscopes. The M-PHY specification is an essential part of the MIPI Alliance's vision for more efficient high-speed interfaces on mobile devices. Compared to the current D-PHY specification, M-PHY supports faster chip-to-chip connections while addressing EMI and power dissipation concerns. By moving quickly to offer M-PHY testing tools, Tektronix is stepping up to help ensure rapid delivery of next-generation mobile devices incorporating M-PHY at the physical layer. "As an active MIPI contributor, Tektronix brings its test and measurement knowledge to the organization, spurring the adoption of D-PHY and M-PHY specifications," said Joel Huloux, Chairman of the MIPI Alliance. "Tektronix is aiding the adoption of the new M-PHY interface by giving designers the testing tools they need to ensure signal integrity and verify performance of increasingly complex designs." Based on the newly ratified MIPI Alliance M-PHY specification, the new Tektronix M-PHY test offering includes a setup library for the popular DPOJET jitter analysis software and methods of implementation (MOI) developed in the close cooperation with UNH-IOL. The solution also includes probing and protocol support from Tektronix partner, The Moving Pixel Company, as well as M-PHY DigRF decode and verification.

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